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Duratio
S. S
(pcs
JESD22-A113
J-STD-02
Preconditioning (MSL 3):
Moisture Preconditioning + 3 x reflow:
UHAST/TC/PC/HAS
N/A
0 Fail
Temperature Cycle:
-55℃/150℃
JESD22-A103
High Temperature Storage:
150
JESD22-A118
Ubias Highly Accelerated Stress Test:
130℃/85%RH/33.3psia
Highly Accelerated Stress Test:
130℃/85%RH/Bias=100V
Power Cycle:
-25℃/150℃/ΔTvj=100℃
High Temp Gate Bias:
150℃/6V VGS
1000hrs
JESD22-A10
High Temp Reverse Bias
150℃/520V VD
JS-001-2014
Charged Device Model ESD